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ROE-RI04 # Comprehensive Experiment on Optical Thin Film Measurement
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Introduction

With the rapid development of optoelectronic technology in the early 21st century, the application of optical thin film devices has developed rapidly with higher performance in wider application fields. In order to enable students to adapt to development, expand the scope of knowledge, broaden their horizons and improve their abilities, a comprehensive optical thin film measurement experiment was developed to conduct research on commonly used coated sheets on the market. From the principles of coating to the testing of actual samples, students can understand the principles and applications of optical coatings thoroughly.


Experiments

Principles and usage experiments of spectrometers;

White light interference measurement of film thickness experiment;

Experiment on measuring the refractive index of coating media;

Simulation experiment of single layer film;

Anti-reflection film simulation and testing experiments;

Reflectance-increasing film simulation and testing experiments;

Cut-off filter simulation and test experiments;

Bandpass filter simulation and testing experiments;

Spectroscope simulation and testing experiments;

Experiment on angular characteristics of bandpass filters.



Experimental Knowledge

Anti-reflection film, reflectance-increasing film, metal film, beam splitter, dichroic mirror, bandpass filter, white light interference, film thickness measurement, energy ratio, reflectance, transmittance.



Typical Testing

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        Film Thickness Measurement Software                Fiber Optic Tungsten Halogen Light                                               

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                Spectrometer                                        Film Thickness Measurement Device


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