Introduction

In many industries such as thin film materials and glass manufacturing, online measurement of thin films is essential. Thin film thickness measurement is an ‘algorithm-intensive’ application in optoelectronic technology, using processing methods such as spectral preprocessing methods, regression algorithms, and Fourier transform signal processing. In this station, students can learn how to obtain the key values that need to be measured from a large amount of data by building an optical path for film thickness measurement.

Training Content

Learn and master the basic principles of white light interference measurement of film thickness;

Use fitting algorithm to measure the film thickness of single-layer MgF2 anti-reflection coating and coated silicon wafer;

Use the Fast Fourier Transform algorithm to measure the thickness of PET films;

Measurement methods for self-constructed thin film samples.