SUMMARY

Atomic force microscopes (AFM) use a highly sensitive microcantilever (microprobe) as a force sensor to detect the atomic force betweenthe cantilever tip and the sample and thus delineate the microstructure of the sample’s surface. YMP-6114 AFM adopts a uniquehorizontal probe structure, overcoming the vertical micro-shift of the fine and coarse adjustments and enhancing the microscope’sstability.

FEATURES

• The AFM probe adopts a unique horizontal design with a unique horizontal visualization of the optical path, making the operation of the instrument more intuitive for researchers and students in the process of scientific research and teaching experiments, and more stable and superior performance of the probe and instrument.

• Adopt high-precision piezoelectric ceramic scanning sensor, X, Y, Z mutually orthogonal three-axis piezoelectric ceramic, can ensure that the scanning image does not distort due to coupling; scanner with better scanning linearity and independence, higher strength and rigidity, both stronger scanning drive, can be applied to both smaller and larger, lighter and heavier samples of scanning imaging.

• With powerful graphics software and functions, color image scanning, processing and display software, Chinese and English operating interface, compatible with Windows XP/Win7/Win8/Win10 and other operating systems. With the mouse, you can select any local scanning area to achieve image panning, positioning and zooming. Surface scanning and line scanning in X and Y directions; nano-level 3D morphological structure and cross-sectional line display of the sample surface can be obtained. Crop, paste, contrast adjustment, brightness adjustment, color adjustment, background color adjustment, image smoothing, filtering, and other image processing functions.   

• The AFM is very easy and convenient to use, and generally requires no dedicated personnel to operate and maintain. Probe installation, sample installation, coarse and fine tuning of the injection, image scanning, image storage and other operations can be done simply. It is especially suitable for scientific research, teaching experiments and product testing.

• It does not need to be used in harsh environments, and is able to operate normally in ordinary laboratories, ordinary lab benches, ordinary classrooms, ordinary tables, etc. It is able to work normally in general environmental conditions with light, slight vibration and people walking around. Our AFM is visible, tangible, easy to maintain, easy to operate, universal, not black box, installation and commissioning is extremely cumbersome, need to be operated by a person, the use of the environment is almost harsh.

EXPERIMENTS

AFM image of nano-imprint structure sample

Part list